BibTeX record conf/icicdt/YoshidaNSIFK23

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@inproceedings{DBLP:conf/icicdt/YoshidaNSIFK23,
  author       = {Keita Yoshida and
                  Ryuichi Nakajima and
                  Shotaro Sugitani and
                  Takafumi Ito and
                  Jun Furuta and
                  Kazutoshi Kobayashi},
  title        = {{SEU} Sensitivity of {PMOS} and {NMOS} Transistors in a 65 nm Bulk
                  Process by {\(\alpha\)}-Particle Irradiation},
  booktitle    = {International Conference on {IC} Design and Technology, {ICICDT} 2023,
                  Tokyo, Japan, September 25-28, 2023},
  pages        = {72--75},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/ICICDT59917.2023.10332287},
  doi          = {10.1109/ICICDT59917.2023.10332287},
  timestamp    = {Thu, 04 Jan 2024 08:13:40 +0100},
  biburl       = {https://dblp.org/rec/conf/icicdt/YoshidaNSIFK23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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