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BibTeX record conf/icicdt/RenWH16
@inproceedings{DBLP:conf/icicdt/RenWH16, author = {Pengpeng Ren and Runsheng Wang and Ru Huang}, title = {Layout dependent {BTI} and {HCI} degradation in nano {CMOS} technology: {A} new time-dependent {LDE} and impacts on circuit at end of life}, booktitle = {International Conference on {IC} Design and Technology, {ICICDT} 2016, Ho Chi Minh, Vietnam, June 27-29, 2016}, pages = {1--3}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/ICICDT.2016.7542063}, doi = {10.1109/ICICDT.2016.7542063}, timestamp = {Mon, 03 Jun 2024 16:30:04 +0200}, biburl = {https://dblp.org/rec/conf/icicdt/RenWH16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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