BibTeX record conf/icicdt/RenWH16

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@inproceedings{DBLP:conf/icicdt/RenWH16,
  author       = {Pengpeng Ren and
                  Runsheng Wang and
                  Ru Huang},
  title        = {Layout dependent {BTI} and {HCI} degradation in nano {CMOS} technology:
                  {A} new time-dependent {LDE} and impacts on circuit at end of life},
  booktitle    = {International Conference on {IC} Design and Technology, {ICICDT} 2016,
                  Ho Chi Minh, Vietnam, June 27-29, 2016},
  pages        = {1--3},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ICICDT.2016.7542063},
  doi          = {10.1109/ICICDT.2016.7542063},
  timestamp    = {Mon, 03 Jun 2024 16:30:04 +0200},
  biburl       = {https://dblp.org/rec/conf/icicdt/RenWH16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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