BibTeX record conf/icicdt/KameiTEO14

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@inproceedings{DBLP:conf/icicdt/KameiTEO14,
  author       = {Masayuki Kamei and
                  Yoshinori Takao and
                  Koji Eriguchi and
                  Kouichi Ono},
  title        = {Random telegraph noise as a new measure of plasma-induced charging
                  damage in MOSFETs},
  booktitle    = {2014 {IEEE} International Conference on {IC} Design {\&} Technology,
                  {ICICDT} 2014, Austin, TX, USA, May 28-30, 2014},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2014},
  url          = {https://doi.org/10.1109/ICICDT.2014.6838598},
  doi          = {10.1109/ICICDT.2014.6838598},
  timestamp    = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl       = {https://dblp.org/rec/conf/icicdt/KameiTEO14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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