Hugo Peres Castilho João Rogério Caldas Pinto António Limas Serafim NN Automated Defect Detection Based on Optimized Thresholding. 790-801 2006 conf/iciar/2006-2 ICIAR (2) http://dx.doi.org/10.1007/11867661_71 db/conf/iciar/iciar2006-2.html#CastilhoPS06