BibTeX record conf/iciar/BoyadjianVTB20

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@inproceedings{DBLP:conf/iciar/BoyadjianVTB20,
  author       = {Quentin Boyadjian and
                  Nicolas Vanderesse and
                  Matthew Toews and
                  Philippe Bocher},
  editor       = {Aur{\'{e}}lio Campilho and
                  Fakhri Karray and
                  Zhou Wang},
  title        = {Detecting Defects in Materials Using Deep Convolutional Neural Networks},
  booktitle    = {Image Analysis and Recognition - 17th International Conference, {ICIAR}
                  2020, P{\'{o}}voa de Varzim, Portugal, June 24-26, 2020, Proceedings,
                  Part {I}},
  series       = {Lecture Notes in Computer Science},
  volume       = {12131},
  pages        = {293--306},
  publisher    = {Springer},
  year         = {2020},
  url          = {https://doi.org/10.1007/978-3-030-50347-5\_26},
  doi          = {10.1007/978-3-030-50347-5\_26},
  timestamp    = {Fri, 30 Jul 2021 13:45:25 +0200},
  biburl       = {https://dblp.org/rec/conf/iciar/BoyadjianVTB20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}