BibTeX record conf/icecsys/OliveiraLM19

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@inproceedings{DBLP:conf/icecsys/OliveiraLM19,
  author       = {Rafael N. M. Oliveira and
                  Alan D. L{\"{u}}dke and
                  Cristina Meinhardt},
  title        = {Radiation Effects in {XOR} Logic Gates at 16nm {CMOS} and FinFET Technology},
  booktitle    = {26th {IEEE} International Conference on Electronics, Circuits and
                  Systems, {ICECS} 2019, Genoa, Italy, November 27-29, 2019},
  pages        = {590--593},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/ICECS46596.2019.8964801},
  doi          = {10.1109/ICECS46596.2019.8964801},
  timestamp    = {Sun, 25 Oct 2020 22:55:47 +0100},
  biburl       = {https://dblp.org/rec/conf/icecsys/OliveiraLM19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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