BibTeX record conf/icecsys/HarmananiH00

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@inproceedings{DBLP:conf/icecsys/HarmananiH00,
  author       = {Haidar Harmanani and
                  Salam Harfoush},
  title        = {Test insertion at the {RT} level using functional test metrics},
  booktitle    = {Proceedings of the 2000 7th {IEEE} International Conference on Electronics,
                  Circuits and Systems, {ICECS} 2000, Jounieh, Lebanon, December 17-20,
                  2000},
  pages        = {1016--1020},
  publisher    = {{IEEE}},
  year         = {2000},
  url          = {https://doi.org/10.1109/ICECS.2000.913048},
  doi          = {10.1109/ICECS.2000.913048},
  timestamp    = {Mon, 09 Aug 2021 14:54:04 +0200},
  biburl       = {https://dblp.org/rec/conf/icecsys/HarmananiH00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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