BibTeX record: conf/iceccs/HayesZ02

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@inproceedings{DBLP:conf/iceccs/HayesZ02,
  author    = {Jane Huffman Hayes and
               Pifu Zhang},
  title     = {Fault Detection Effectiveness of Spathic Test Data},
  booktitle = {8th International Conference on Engineering of Complex Computer Systems
               {(ICECCS} 2002), 2-4 December 2002, Greenbelt, MD, {USA}},
  pages     = {183--192},
  year      = {2002},
  crossref  = {DBLP:conf/iceccs/2002},
  url       = {http://doi.ieeecomputersociety.org/10.1109/ICECCS.2002.1181511},
  doi       = {10.1109/ICECCS.2002.1181511},
  timestamp = {Wed, 26 Oct 2011 12:00:34 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/iceccs/HayesZ02},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/iceccs/2002,
  title     = {8th International Conference on Engineering of Complex Computer Systems
               {(ICECCS} 2002), 2-4 December 2002, Greenbelt, MD, {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {2002},
  isbn      = {0-7695-1757-9},
  timestamp = {Tue, 02 Dec 2003 13:00:00 +0100},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/iceccs/2002},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}