BibTeX record conf/iceb/TongLHLY04

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@inproceedings{DBLP:conf/iceb/TongLHLY04,
  author       = {Leeing Tong and
                  Hsingyin Lee and
                  Chifeng Huang and
                  Changke Lin and
                  Chienhui Yang},
  editor       = {Jian Chen},
  title        = {Constructing Control Process for Wafer Defects Using Data Mining Technique},
  booktitle    = {The Fourth International Conference on Electronic Business - Shaping
                  Business Strategy in a Networked World},
  pages        = {1125--1129},
  publisher    = {Academic Publishers/World Publishing Corporation},
  year         = {2004},
  timestamp    = {Tue, 22 Feb 2005 15:21:39 +0100},
  biburl       = {https://dblp.org/rec/conf/iceb/TongLHLY04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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