Wu Woan Kim Parallel Testing Method by Partitioning Circuit Based on the Exhaustive Test. 262-271 http://springerlink.metapress.com/openurl.asp?genre=article&issn=0302-9743&volume=3044&spage=262 2004 conf/iccsa/2004-2 ICCSA (2) db/conf/iccsa/iccsa2004-2.html#Kim04a