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BibTeX record conf/iccids/SujeeSS20
@inproceedings{DBLP:conf/iccids/SujeeSS20, author = {R. Sujee and D. Shanthosh and L. Sudharsun}, editor = {Aravindan Chandrabose and Ulrich Furbach and Ashish Ghosh and Anand Kumar M}, title = {Fabric Defect Detection Using YOLOv2 and {YOLO} v3 Tiny}, booktitle = {Computational Intelligence in Data Science - Third {IFIP} {TC} 12 International Conference, {ICCIDS} 2020, Chennai, India, February 20-22, 2020, Revised Selected Papers}, series = {{IFIP} Advances in Information and Communication Technology}, volume = {578}, pages = {196--204}, publisher = {Springer}, year = {2020}, url = {https://doi.org/10.1007/978-3-030-63467-4\_15}, doi = {10.1007/978-3-030-63467-4\_15}, timestamp = {Fri, 08 Sep 2023 21:18:23 +0200}, biburl = {https://dblp.org/rec/conf/iccids/SujeeSS20.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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