BibTeX record conf/iccel/LeeKHK23

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@inproceedings{DBLP:conf/iccel/LeeKHK23,
  author       = {Jimin Lee and
                  Jae Min Kim and
                  Junho Huh and
                  Jungwoo Kim},
  title        = {Software-driven Debug Framework for Embedded RISC-V, that Transparently
                  Emulates the Industry Standard Debug Framework},
  booktitle    = {{IEEE} International Conference on Consumer Electronics, {ICCE} 2023,
                  Las Vegas, NV, USA, January 6-8, 2023},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/ICCE56470.2023.10043490},
  doi          = {10.1109/ICCE56470.2023.10043490},
  timestamp    = {Tue, 05 Dec 2023 09:28:58 +0100},
  biburl       = {https://dblp.org/rec/conf/iccel/LeeKHK23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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