BibTeX record conf/icce-tw/YunGKMK14

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@inproceedings{DBLP:conf/icce-tw/YunGKMK14,
  author       = {Jim{-}Woo Yun and
                  Heon Gu and
                  Dae{-}Hwan Kim and
                  Hoi{-}Sik Moon and
                  Sung{-}Jea Ko},
  title        = {Automatic mura inspection using the principal component analysis for
                  the {TFT-LCD} panel},
  booktitle    = {{IEEE} International Conference on Consumer Electronics - Taiwan,
                  {ICCE-TW} 2014, Taipei, Taiwan, May 26-28, 2014},
  pages        = {109--110},
  publisher    = {{IEEE}},
  year         = {2014},
  url          = {https://doi.org/10.1109/ICCE-TW.2014.6904008},
  doi          = {10.1109/ICCE-TW.2014.6904008},
  timestamp    = {Thu, 25 Nov 2021 16:44:55 +0100},
  biburl       = {https://dblp.org/rec/conf/icce-tw/YunGKMK14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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