BibTeX record conf/iccd/ZhangA11

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@inproceedings{DBLP:conf/iccd/ZhangA11,
  author       = {Yu Zhang and
                  Vishwani D. Agrawal},
  title        = {Reduced complexity test generation algorithms for transition fault
                  diagnosis},
  booktitle    = {{IEEE} 29th International Conference on Computer Design, {ICCD} 2011,
                  Amherst, MA, USA, October 9-12, 2011},
  pages        = {96--101},
  publisher    = {{IEEE} Computer Society},
  year         = {2011},
  url          = {https://doi.org/10.1109/ICCD.2011.6081382},
  doi          = {10.1109/ICCD.2011.6081382},
  timestamp    = {Thu, 23 Mar 2023 23:59:54 +0100},
  biburl       = {https://dblp.org/rec/conf/iccd/ZhangA11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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