@inproceedings{DBLP:conf/iccd/YousifG95,
author = {Abdel-Fattah Yousif and
Jun Gu},
title = {Concurrent automatic test pattern generation algorithm for
combinational circuits},
booktitle = {ICCD},
year = {1995},
pages = {286-291},
ee = {http://computer.org/proceedings/iccd/7165/71650286abs.htm},
crossref = {DBLP:conf/iccd/1995},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/iccd/1995,
title = {1995 International Conference on Computer Design (ICCD '95),
VLSI in Computers and Processors, October 2-4, 1995, Austin,
TX, USA, Proceedings},
publisher = {IEEE Computer Society},
year = {1995},
isbn = {0-8186-7165-3},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Last update 2009-06-10 CET by the DBLP Team — 
Data released under the ODC-BY 1.0 license — See also our legal information page
