BibTeX record conf/iccd/WuTYL07

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@inproceedings{DBLP:conf/iccd/WuTYL07,
  author       = {Wei Wu and
                  Sheldon X.{-}D. Tan and
                  Jun Yang and
                  Shih{-}Lien Lu},
  title        = {Improving the reliability of on-chip data caches under process variations},
  booktitle    = {25th International Conference on Computer Design, {ICCD} 2007, 7-10
                  October 2007, Lake Tahoe, CA, USA, Proceedings},
  pages        = {325--332},
  publisher    = {{IEEE}},
  year         = {2007},
  url          = {https://doi.org/10.1109/ICCD.2007.4601920},
  doi          = {10.1109/ICCD.2007.4601920},
  timestamp    = {Thu, 23 Mar 2023 23:59:54 +0100},
  biburl       = {https://dblp.org/rec/conf/iccd/WuTYL07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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