BibTeX record conf/iccd/WolberGV94

download as .bib file

@inproceedings{DBLP:conf/iccd/WolberGV94,
  author       = {R. Wolber and
                  Uwe Gl{\"{a}}ser and
                  Heinrich Theodor Vierhaus},
  title        = {Testability Analysis for Test Generation in Synchronous Sequential
                  Circuits},
  booktitle    = {Proceedings 1994 {IEEE} International Conference on Computer Design:
                  {VLSI} in Computer {\&} Processors, {ICCD} '94, Cambridge, MA,
                  USA, October 10-12, 1994},
  pages        = {350--353},
  publisher    = {{IEEE} Computer Society},
  year         = {1994},
  url          = {https://doi.org/10.1109/ICCD.1994.331924},
  doi          = {10.1109/ICCD.1994.331924},
  timestamp    = {Thu, 23 Mar 2023 23:59:54 +0100},
  biburl       = {https://dblp.org/rec/conf/iccd/WolberGV94.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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