BibTeX record conf/iccd/SongBBG03

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@inproceedings{DBLP:conf/iccd/SongBBG03,
  author       = {Hui{-}Yuan Song and
                  S. Bohidar and
                  R. Iris Bahar and
                  Joel Grodstein},
  title        = {Symbolic Failure Analysis of Custom Circuits due to Excessive Leakage
                  Current},
  booktitle    = {21st International Conference on Computer Design {(ICCD} 2003),VLSI
                  in Computers and Processors, 13-15 October 2003, San Jose, CA, USA,
                  Proceedings},
  pages        = {70--75},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://doi.org/10.1109/ICCD.2003.1240875},
  doi          = {10.1109/ICCD.2003.1240875},
  timestamp    = {Thu, 23 Mar 2023 23:59:55 +0100},
  biburl       = {https://dblp.org/rec/conf/iccd/SongBBG03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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