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BibTeX record conf/iccd/ShiWGX16
@inproceedings{DBLP:conf/iccd/ShiWGX16, author = {Xin Shi and Fei Wu and Xidong Guan and Changsheng Xie}, title = {Error behaviors testing with temperature and magnetism dependency for {MRAM}}, booktitle = {34th {IEEE} International Conference on Computer Design, {ICCD} 2016, Scottsdale, AZ, USA, October 2-5, 2016}, pages = {356--359}, publisher = {{IEEE} Computer Society}, year = {2016}, url = {https://doi.org/10.1109/ICCD.2016.7753302}, doi = {10.1109/ICCD.2016.7753302}, timestamp = {Thu, 23 Mar 2023 23:59:54 +0100}, biburl = {https://dblp.org/rec/conf/iccd/ShiWGX16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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