BibTeX record conf/iccd/RanaC14

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@inproceedings{DBLP:conf/iccd/RanaC14,
  author       = {Manish Rana and
                  Ramon Canal},
  title        = {{REEM:} Failure/non-failure region estimation method for {SRAM} yield
                  analysis},
  booktitle    = {32nd {IEEE} International Conference on Computer Design, {ICCD} 2014,
                  Seoul, South Korea, October 19-22, 2014},
  pages        = {36--41},
  publisher    = {{IEEE} Computer Society},
  year         = {2014},
  url          = {https://doi.org/10.1109/ICCD.2014.6974659},
  doi          = {10.1109/ICCD.2014.6974659},
  timestamp    = {Thu, 23 Mar 2023 23:59:53 +0100},
  biburl       = {https://dblp.org/rec/conf/iccd/RanaC14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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