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BibTeX record conf/iccd/RadtkeBA95
@inproceedings{DBLP:conf/iccd/RadtkeBA95, author = {Stefan Radtke and Jens Bargfrede and Walter Anheier}, title = {Distributed automatic test pattern generation with a parallel {FAN} algorithm}, booktitle = {1995 International Conference on Computer Design {(ICCD} '95), {VLSI} in Computers and Processors, October 2-4, 1995, Austin, TX, USA, Proceedings}, pages = {698--702}, publisher = {{IEEE} Computer Society}, year = {1995}, url = {https://doi.org/10.1109/ICCD.1995.528944}, doi = {10.1109/ICCD.1995.528944}, timestamp = {Thu, 23 Mar 2023 23:59:54 +0100}, biburl = {https://dblp.org/rec/conf/iccd/RadtkeBA95.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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