BibTeX record conf/iccd/PuriH15

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@inproceedings{DBLP:conf/iccd/PuriH15,
  author       = {Prateek Puri and
                  Michael S. Hsiao},
  title        = {{SI-SMART:} Functional test generation for {RTL} circuits using loop
                  abstraction and learning recurrence relationships},
  booktitle    = {33rd {IEEE} International Conference on Computer Design, {ICCD} 2015,
                  New York City, NY, USA, October 18-21, 2015},
  pages        = {38--45},
  publisher    = {{IEEE} Computer Society},
  year         = {2015},
  url          = {https://doi.org/10.1109/ICCD.2015.7357082},
  doi          = {10.1109/ICCD.2015.7357082},
  timestamp    = {Thu, 23 Mar 2023 23:59:54 +0100},
  biburl       = {https://dblp.org/rec/conf/iccd/PuriH15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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