BibTeX record conf/iccd/MayrhauserMWO94

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@inproceedings{DBLP:conf/iccd/MayrhauserMWO94,
  author       = {Anneliese von Mayrhauser and
                  Richard T. Mraz and
                  Jeff Walls and
                  Pete Ocken},
  title        = {Domain Based Testing: Increasing Test Case Reuse},
  booktitle    = {Proceedings 1994 {IEEE} International Conference on Computer Design:
                  {VLSI} in Computer {\&} Processors, {ICCD} '94, Cambridge, MA,
                  USA, October 10-12, 1994},
  pages        = {484--491},
  publisher    = {{IEEE} Computer Society},
  year         = {1994},
  url          = {https://doi.org/10.1109/ICCD.1994.331957},
  doi          = {10.1109/ICCD.1994.331957},
  timestamp    = {Thu, 23 Mar 2023 23:59:53 +0100},
  biburl       = {https://dblp.org/rec/conf/iccd/MayrhauserMWO94.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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