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BibTeX record conf/iccd/LiuB18
@inproceedings{DBLP:conf/iccd/LiuB18, author = {Zeye Liu and Ronald D. Blanton}, title = {Back-End Layout Reflection for Test Chip Design}, booktitle = {36th {IEEE} International Conference on Computer Design, {ICCD} 2018, Orlando, FL, USA, October 7-10, 2018}, pages = {456--463}, publisher = {{IEEE} Computer Society}, year = {2018}, url = {https://doi.org/10.1109/ICCD.2018.00074}, doi = {10.1109/ICCD.2018.00074}, timestamp = {Thu, 23 Mar 2023 23:59:55 +0100}, biburl = {https://dblp.org/rec/conf/iccd/LiuB18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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