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@inproceedings{DBLP:conf/iccd/LiMA93,
author = {Weidong Li and
Carl McCrosky and
Mostafa H. Abd-El-Barr},
title = {Reducing the Cost of Test Pattern Generation by Information
Reusing},
booktitle = {ICCD},
year = {1993},
pages = {310-313},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2002-03-12 by Michael Ley (ley@uni-trier.de)