<?xml version="1.0"?>
<dblp>
<inproceedings key="conf/iccd/HussinYOF06" mdate="2008-02-08">
<author>Fawnizu Azmadi Hussin</author>
<author>Tomokazu Yoneda</author>
<author>Alex Orailoglu</author>
<author>Hideo Fujiwara</author>
<title>Power-Constrained SOC Test Schedules through Utilization of Functional Buses.</title>
<year>2006</year>
<crossref>conf/iccd/2006</crossref>
<booktitle>ICCD</booktitle>
<ee>http://www.iccd-conference.org/proceedings/2006/paper_165.pdf</ee>
<url>db/conf/iccd/iccd2006.html#HussinYOF06</url>
</inproceedings>
</dblp>
