BibTeX record conf/iccd/HigamiKTKP03

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@inproceedings{DBLP:conf/iccd/HigamiKTKP03,
  author       = {Yoshinobu Higami and
                  Shin{-}ya Kobayashi and
                  Yuzo Takamatsu and
                  Seiji Kajihara and
                  Irith Pomeranz},
  title        = {A Method to Find Don't Care Values in Test Sequences for Sequential
                  Circuits},
  booktitle    = {21st International Conference on Computer Design {(ICCD} 2003),VLSI
                  in Computers and Processors, 13-15 October 2003, San Jose, CA, USA,
                  Proceedings},
  pages        = {397},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://doi.org/10.1109/ICCD.2003.1240927},
  doi          = {10.1109/ICCD.2003.1240927},
  timestamp    = {Thu, 23 Mar 2023 23:59:54 +0100},
  biburl       = {https://dblp.org/rec/conf/iccd/HigamiKTKP03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}