| | |
@inproceedings{DBLP:conf/iccd/ChangKNRO97,
author = {Norman Chang and
Valery Kanevsky and
O. Sam Nakagawa and
Khalid Rahmat and
Soo-Young Oh},
title = {Fast Generation of Statistically-based Worst-Case Modeling
of On-Chip Interconnect},
booktitle = {ICCD},
year = {1997},
pages = {720-725},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
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