BibTeX record conf/iccc2/WangC22

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@inproceedings{DBLP:conf/iccc2/WangC22,
  author       = {Xu Wang and
                  Pan Cheng},
  editor       = {Yujiu Yang and
                  Xiaohui Wang and
                  Liang{-}Jie Zhang},
  title        = {Deep Learning-Based Visual Defect Inspection System for Pouch Battery
                  Packs},
  booktitle    = {Cognitive Computing - {ICCC} 2022 - 6th International Conference,
                  Held as Part of the Services Conference Federation, {SCF} 2022, Honolulu,
                  HI, USA, December 10-14, 2022, Proceedings},
  series       = {Lecture Notes in Computer Science},
  volume       = {13734},
  pages        = {54--64},
  publisher    = {Springer},
  year         = {2022},
  url          = {https://doi.org/10.1007/978-3-031-23585-6\_5},
  doi          = {10.1007/978-3-031-23585-6\_5},
  timestamp    = {Mon, 19 Aug 2024 08:27:53 +0200},
  biburl       = {https://dblp.org/rec/conf/iccc2/WangC22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}