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BibTeX record conf/iccc2/WangC22
@inproceedings{DBLP:conf/iccc2/WangC22, author = {Xu Wang and Pan Cheng}, editor = {Yujiu Yang and Xiaohui Wang and Liang{-}Jie Zhang}, title = {Deep Learning-Based Visual Defect Inspection System for Pouch Battery Packs}, booktitle = {Cognitive Computing - {ICCC} 2022 - 6th International Conference, Held as Part of the Services Conference Federation, {SCF} 2022, Honolulu, HI, USA, December 10-14, 2022, Proceedings}, series = {Lecture Notes in Computer Science}, volume = {13734}, pages = {54--64}, publisher = {Springer}, year = {2022}, url = {https://doi.org/10.1007/978-3-031-23585-6\_5}, doi = {10.1007/978-3-031-23585-6\_5}, timestamp = {Mon, 19 Aug 2024 08:27:53 +0200}, biburl = {https://dblp.org/rec/conf/iccc2/WangC22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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