BibTeX record conf/iccad/ZhuoABS10

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@inproceedings{DBLP:conf/iccad/ZhuoABS10,
  author       = {Cheng Zhuo and
                  Kanak Agarwal and
                  David T. Blaauw and
                  Dennis Sylvester},
  editor       = {Louis Scheffer and
                  Joel R. Phillips and
                  Alan J. Hu},
  title        = {Active learning framework for post-silicon variation extraction and
                  test cost reduction},
  booktitle    = {2010 International Conference on Computer-Aided Design, {ICCAD} 2010,
                  San Jose, CA, USA, November 7-11, 2010},
  pages        = {508--515},
  publisher    = {{IEEE}},
  year         = {2010},
  url          = {https://doi.org/10.1109/ICCAD.2010.5653806},
  doi          = {10.1109/ICCAD.2010.5653806},
  timestamp    = {Tue, 04 Jun 2024 20:29:14 +0200},
  biburl       = {https://dblp.org/rec/conf/iccad/ZhuoABS10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}