BibTeX record conf/iccad/YuZCK23

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@inproceedings{DBLP:conf/iccad/YuZCK23,
  author       = {Qiao Yu and
                  Wengui Zhang and
                  Jorge Cardoso and
                  Odej Kao},
  title        = {Exploring Error Bits for Memory Failure Prediction: An In-Depth Correlative
                  Study},
  booktitle    = {{IEEE/ACM} International Conference on Computer Aided Design, {ICCAD}
                  2023, San Francisco, CA, USA, October 28 - Nov. 2, 2023},
  pages        = {1--9},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/ICCAD57390.2023.10323692},
  doi          = {10.1109/ICCAD57390.2023.10323692},
  timestamp    = {Wed, 03 Jan 2024 08:34:26 +0100},
  biburl       = {https://dblp.org/rec/conf/iccad/YuZCK23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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