BibTeX record conf/iccad/WenMKWSK04

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@inproceedings{DBLP:conf/iccad/WenMKWSK04,
  author       = {Xiaoqing Wen and
                  Tokiharu Miyoshi and
                  Seiji Kajihara and
                  Laung{-}Terng Wang and
                  Kewal K. Saluja and
                  Kozo Kinoshita},
  title        = {On per-test fault diagnosis using the X-fault model},
  booktitle    = {2004 International Conference on Computer-Aided Design, {ICCAD} 2004,
                  San Jose, CA, USA, November 7-11, 2004},
  pages        = {633--640},
  publisher    = {{IEEE} Computer Society / {ACM}},
  year         = {2004},
  url          = {https://doi.org/10.1109/ICCAD.2004.1382653},
  doi          = {10.1109/ICCAD.2004.1382653},
  timestamp    = {Fri, 24 Mar 2023 00:01:52 +0100},
  biburl       = {https://dblp.org/rec/conf/iccad/WenMKWSK04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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