BibTeX record conf/iccad/WangRPLR02

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@inproceedings{DBLP:conf/iccad/WangRPLR02,
  author       = {Chen Wang and
                  Sudhakar M. Reddy and
                  Irith Pomeranz and
                  Xijiang Lin and
                  Janusz Rajski},
  editor       = {Lawrence T. Pileggi and
                  Andreas Kuehlmann},
  title        = {Conflict driven techniques for improving deterministic test pattern
                  generation},
  booktitle    = {Proceedings of the 2002 {IEEE/ACM} International Conference on Computer-aided
                  Design, {ICCAD} 2002, San Jose, California, USA, November 10-14, 2002},
  pages        = {87--93},
  publisher    = {{ACM} / {IEEE} Computer Society},
  year         = {2002},
  url          = {https://doi.org/10.1145/774572.774585},
  doi          = {10.1145/774572.774585},
  timestamp    = {Fri, 24 Mar 2023 00:01:52 +0100},
  biburl       = {https://dblp.org/rec/conf/iccad/WangRPLR02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}