BibTeX record conf/iccad/TsengCWL21

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@inproceedings{DBLP:conf/iccad/TsengCWL21,
  author       = {Hsiao{-}Yin Tseng and
                  I{-}Wei Chiu and
                  Mu{-}Ting Wu and
                  James Chien{-}Mo Li},
  title        = {Machine Learning-Based Test Pattern Generation for Neuromorphic Chips},
  booktitle    = {{IEEE/ACM} International Conference On Computer Aided Design, {ICCAD}
                  2021, Munich, Germany, November 1-4, 2021},
  pages        = {1--7},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/ICCAD51958.2021.9643459},
  doi          = {10.1109/ICCAD51958.2021.9643459},
  timestamp    = {Mon, 03 Jan 2022 22:34:27 +0100},
  biburl       = {https://dblp.org/rec/conf/iccad/TsengCWL21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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