BibTeX record conf/iccad/SinghMO05

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@inproceedings{DBLP:conf/iccad/SinghMO05,
  author       = {Ashish Kumar Singh and
                  Murari Mani and
                  Michael Orshansky},
  title        = {Statistical technology mapping for parametric yield},
  booktitle    = {2005 International Conference on Computer-Aided Design, {ICCAD} 2005,
                  San Jose, CA, USA, November 6-10, 2005},
  pages        = {511--518},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/ICCAD.2005.1560121},
  doi          = {10.1109/ICCAD.2005.1560121},
  timestamp    = {Fri, 24 Mar 2023 00:01:52 +0100},
  biburl       = {https://dblp.org/rec/conf/iccad/SinghMO05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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