BibTeX
@inproceedings{DBLP:conf/iccad/SchrikDM02,
author = {Eelco Schrik and
Patrick Dewilde and
N. P. van der Meijs},
title = {Theoretical and practical validation of combined BEM/FEM
substrate resistance modeling},
booktitle = {ICCAD},
year = {2002},
pages = {10-15},
ee = {http://doi.acm.org/10.1145/774572.774574},
crossref = {DBLP:conf/iccad/2002},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/iccad/2002,
editor = {Lawrence T. Pileggi and
Andreas Kuehlmann},
title = {Proceedings of the 2002 IEEE/ACM International Conference
on Computer-aided Design, 2002, San Jose, California, USA,
November 10-14, 2002},
booktitle = {ICCAD},
publisher = {ACM},
year = {2002},
isbn = {0-7803-7607-2},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2006-06-27 by Michael Ley (ley@uni-trier.de)