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DBLP Record 'conf/iccad/SchrikDM02'

BibTeX

@inproceedings{DBLP:conf/iccad/SchrikDM02,
  author    = {Eelco Schrik and
               Patrick Dewilde and
               N. P. van der Meijs},
  title     = {Theoretical and practical validation of combined BEM/FEM
               substrate resistance modeling},
  booktitle = {ICCAD},
  year      = {2002},
  pages     = {10-15},
  ee        = {http://doi.acm.org/10.1145/774572.774574},
  crossref  = {DBLP:conf/iccad/2002},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/iccad/2002,
  editor    = {Lawrence T. Pileggi and
               Andreas Kuehlmann},
  title     = {Proceedings of the 2002 IEEE/ACM International Conference
               on Computer-aided Design, 2002, San Jose, California, USA,
               November 10-14, 2002},
  booktitle = {ICCAD},
  publisher = {ACM},
  year      = {2002},
  isbn      = {0-7803-7607-2},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

Copyright © 2006-06-27 by Michael Ley (ley@uni-trier.de)