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BibTeX record conf/iccad/SchrikDM02
@inproceedings{DBLP:conf/iccad/SchrikDM02, author = {Eelco Schrik and Patrick M. Dewilde and N. P. van der Meijs}, editor = {Lawrence T. Pileggi and Andreas Kuehlmann}, title = {Theoretical and practical validation of combined {BEM/FEM} substrate resistance modeling}, booktitle = {Proceedings of the 2002 {IEEE/ACM} International Conference on Computer-aided Design, {ICCAD} 2002, San Jose, California, USA, November 10-14, 2002}, pages = {10--15}, publisher = {{ACM} / {IEEE} Computer Society}, year = {2002}, url = {https://doi.org/10.1145/774572.774574}, doi = {10.1145/774572.774574}, timestamp = {Fri, 24 Mar 2023 00:01:52 +0100}, biburl = {https://dblp.org/rec/conf/iccad/SchrikDM02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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