BibTeX
@inproceedings{DBLP:conf/iccad/RaviDP07,
author = {Srivaths Ravi and
V. R. Devanathan and
Rubin A. Parekhji},
title = {Methodology for low power test pattern generation using
activity threshold control logic},
booktitle = {ICCAD},
year = {2007},
pages = {526-529},
ee = {http://doi.acm.org/10.1145/1326073.1326181},
crossref = {DBLP:conf/iccad/2007},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/iccad/2007,
editor = {Georges G. E. Gielen},
title = {2007 International Conference on Computer-Aided Design (ICCAD'07),
November 5-8, 2007, San Jose, CA, USA},
booktitle = {ICCAD},
publisher = {IEEE},
year = {2007},
isbn = {1-4244-1382-6},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2007-12-31 by Michael Ley (ley@uni-trier.de)