Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification.

Kohei Miyase Kenji Noda Hideaki Ito Kazumi Hatayama Takashi Aikyo Yuta Yamato Hiroshi Furukawa Xiaoqing Wen Seiji Kajihara Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification. 52-58 2008 ICCAD http://doi.acm.org/10.1145/1509456.1509480 conf/iccad/2008 db/conf/iccad/iccad2008.html#MiyaseNIHAYFWK08