@inproceedings{DBLP:conf/iccad/MiyaseNIHAYFWK08,
author = {Kohei Miyase and
Kenji Noda and
Hideaki Ito and
Kazumi Hatayama and
Takashi Aikyo and
Yuta Yamato and
Hiroshi Furukawa and
Xiaoqing Wen and
Seiji Kajihara},
title = {Effective IR-drop reduction in at-speed scan testing using
Distribution-Controlling X-Identification},
booktitle = {ICCAD},
year = {2008},
pages = {52-58},
ee = {http://doi.acm.org/10.1145/1509456.1509480},
crossref = {DBLP:conf/iccad/2008},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/iccad/2008,
editor = {Sani R. Nassif and
Jaijeet S. Roychowdhury},
title = {2008 International Conference on Computer-Aided Design (ICCAD'08),
November 10-13, 2008, San Jose, CA, USA},
booktitle = {ICCAD},
publisher = {IEEE},
year = {2008},
isbn = {978-1-4244-2820-5},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
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