Joint design-time and post-silicon minimization of parametric yield loss using adjustable robust optimization.

Murari Mani Ashish Kumar Singh Michael Orshansky Joint design-time and post-silicon minimization of parametric yield loss using adjustable robust optimization. 19-26 2006 conf/iccad/2006 ICCAD http://doi.acm.org/10.1145/1233501.1233507 db/conf/iccad/iccad2006.html#ManiSO06