Efficient transient electrothermal simulation of CMOS VLSI circuits under electrical overstress.

Tong Li Ching-Han Tsai Sung-Mo Kang Efficient transient electrothermal simulation of CMOS VLSI circuits under electrical overstress. 6-11 1998 ICCAD http://doi.acm.org/10.1145/288548.288553 db/conf/iccad/iccad1998.html#LiTK98