Sang-Hoon Lee Chang-hoon Choi Jeong-Taek Kong Wong-Seong Lee Jei-Hwan Yoo An efficient statistical analysis methodology and its application to high-density DRAMs. 678-683 1997 ICCAD http://doi.acm.org/10.1145/266388.266606 db/conf/iccad/iccad1997.html#LeeCKLY97