Seiji Kajihara Shohei Morishima Masahiro Yamamoto Xiaoqing Wen Masayasu Fukunaga Kazumi Hatayama Takashi Aikyo Estimation of delay test quality and its application to test generation. 413-417 2007 conf/iccad/2007 ICCAD http://doi.acm.org/10.1145/1326073.1326159 db/conf/iccad/iccad2007.html#KajiharaMYWFHA07