Uwe Gläser Heinrich Theodor Vierhaus M. Kley A. Wiederhold Test generation for bridging faults in CMOS ICs based on current monitoring versus signal propagation. 36-39 1994 conf/iccad/1994 ICCAD http://doi.acm.org/10.1145/191326.191346 db/conf/iccad/iccad1994.html#GlaserVKW94