BibTeX record conf/iccad/GengY0021

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@inproceedings{DBLP:conf/iccad/GengY0021,
  author       = {Hao Geng and
                  Fan Yang and
                  Xuan Zeng and
                  Bei Yu},
  title        = {When Wafer Failure Pattern Classification Meets Few-shot Learning
                  and Self-Supervised Learning},
  booktitle    = {{IEEE/ACM} International Conference On Computer Aided Design, {ICCAD}
                  2021, Munich, Germany, November 1-4, 2021},
  pages        = {1--8},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/ICCAD51958.2021.9643518},
  doi          = {10.1109/ICCAD51958.2021.9643518},
  timestamp    = {Thu, 16 Jun 2022 00:54:45 +0200},
  biburl       = {https://dblp.org/rec/conf/iccad/GengY0021.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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