Statistical modeling of metal-gate work-function variability in emerging device technologies and implications for circuit design.

Hamed F. Dadgour Vivek De Kaustav Banerjee Statistical modeling of metal-gate work-function variability in emerging device technologies and implications for circuit design. 270-277 2008 ICCAD http://doi.acm.org/10.1145/1509456.1509523 conf/iccad/2008 db/conf/iccad/iccad2008.html#DadgourDB08