Kaviraj Chopra Cheng Zhuo David Blaauw Dennis Sylvester A statistical approach for full-chip gate-oxide reliability analysis. 698-705 2008 ICCAD http://doi.acm.org/10.1145/1509456.1509609 conf/iccad/2008 db/conf/iccad/iccad2008.html#ChopraZBS08