LOT: logic optimization with testability-new transformations using recursive learning.

Mitrajit Chatterjee Dhiraj K. Pradhan Wolfgang Kunz LOT: logic optimization with testability-new transformations using recursive learning. 318-325 1995 conf/iccad/1995 ICCAD http://doi.acm.org/10.1145/224841.225057 db/conf/iccad/iccad1995.html#ChatterjeePK95