BibTeX record conf/i2mtc/PompeoTS17

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@inproceedings{DBLP:conf/i2mtc/PompeoTS17,
  author       = {Nicola Pompeo and
                  Kostiantyn Torokhtii and
                  Enrico Silva},
  title        = {Surface impedance measurements in thin conducting films: Substrate
                  and finite-thickness-induced uncertainties},
  booktitle    = {{IEEE} International Instrumentation and Measurement Technology Conference,
                  {I2MTC} 2017, Torino, Italy, May 22-25, 2017},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/I2MTC.2017.7969902},
  doi          = {10.1109/I2MTC.2017.7969902},
  timestamp    = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl       = {https://dblp.org/rec/conf/i2mtc/PompeoTS17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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