BibTeX record conf/i2mtc/MeiPLSMZ23

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@inproceedings{DBLP:conf/i2mtc/MeiPLSMZ23,
  author       = {Wenjuan Mei and
                  Chaowu Pan and
                  Zhen Liu and
                  Yuanzhang Su and
                  Yusong Mei and
                  Qi Zhou},
  title        = {Trap Dynamic Detection of GaN {HEMT} under Repetitive Short Circuit
                  Degradation},
  booktitle    = {{IEEE} International Instrumentation and Measurement Technology Conference,
                  {I2MTC} 2023, Kuala Lumpur, Malaysia, May 22-25, 2023},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/I2MTC53148.2023.10176003},
  doi          = {10.1109/I2MTC53148.2023.10176003},
  timestamp    = {Tue, 25 Jul 2023 16:27:13 +0200},
  biburl       = {https://dblp.org/rec/conf/i2mtc/MeiPLSMZ23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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